Browsing by Author "Jeong Y.-S."
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Bayesian framework for fault variable identification
Turkoz M.; Kim S.; Jeong Y.-S.; Jeong M.K.; Elsayed E.A.; Al-Khalifa K.N.; Hamouda A.M.... more authors ... less authors ( Taylor and Francis Inc. , 2019 , Article)In most manufacturing processes, identifying the faulty process variables that may lead to process changes is crucial for quality engineers and practitioners. There are several parametric procedures for identifying faulty ...