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المؤلفQidwai, Uvais
المؤلفBettayeb, Maamar
المؤلفYamani, Ahmed
تاريخ الإتاحة2009-12-29T06:15:50Z
تاريخ النشر2007-11-24
اسم المنشورIEEE International Conference on Signal Processing and Communications (ICSPC) 2007
الاقتباسQidwai, U.; Bettayeb, M.; Yamani, A., "Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing," Signal Processing and Communications, 2007. ICSPC 2007. IEEE International Conference on , vol., no., pp.632-635, 24-27 Nov. 2007
معرّف المصادر الموحدhttp://dx.doi.org/10.1109/ICSPC.2007.4728398
معرّف المصادر الموحدhttp://hdl.handle.net/10576/10550
الملخصClassification of defects using ultrasonic nondestructive testing (NDT) is primarily done in the field of industrial materials to provide useful information in order to assist in making administrative decisions in terms of maintenance and replacement. The technique presented in this paper utilizes the concept of defect induction as a convolution process between the clean sample and the defect signature. Hence, to identify the type of defect a deconvolution approach can be useful. Due to several similarities between the ultrasonic echoes and the usual modulated sinusoids, a motivation is present to use 4th order statistics for completely defining the waveform. Such a definition, when compared with standard defects, will provide useful insight in terms of defect classifications and understanding.
اللغةen
الناشرIEEE
الموضوعDefect Deconvolution
Ultrasonic Nondestructive Testing
العنوانDefect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing
النوعConference Paper
dc.accessType Abstract Only


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