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المؤلفHassan, Walid M.I.
المؤلفKhader, Mahmoud M.
المؤلفVerma, Amit
المؤلفNekovei, Reza
المؤلفAnantram, M. P.
تاريخ الإتاحة2024-06-05T09:01:11Z
تاريخ النشر2015-07
اسم المنشورIEEE-NANO 2015 - 15th International Conference on Nanotechnology
المعرّفhttp://dx.doi.org/10.1109/NANO.2015.7388774
الاقتباسHassan, W. M., Khader, M. M., Verma, A., Nekovei, R., & Anantram, M. P. (2015, July). Oxygen passivation as effective technique for tailoring the nature of band gap of silicon nanowires. In 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) (pp. 951-954). IEEE.
الترقيم الدولي الموحد للكتاب 978-1-4673-8155-0
معرّف المصادر الموحدhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84964319216&origin=inward
معرّف المصادر الموحدhttp://hdl.handle.net/10576/55834
الملخصSilicon nanowires have been subjected to several experiential and theoretical studies, including chemical tuning with different substituents aiming to tailor the band gap as well as increasing optical absorption efficiency of solar energy. In this study, we report the effect of oxidation on silicon nanowires compared to hydroxyl passivation using theoretical DFT calculations. Surprisingly, extensive oxidation dramatically decreases the silicon nanowire band gap down to 0.26 eV. Furthermore, moderate oxidation substantially decreases the band gap compared to the equivalent amount of hydroxyl-passivated silicon nanowires. The dipole moment resulting from the different possible orientations of substituents or oxygen atoms shows a minor effect on the band gap. The relation between the band gap, percentage of oxidation, and their effects on geometrical deformations are discussed in details.
اللغةen
الناشرInstitute of Electrical and Electronics Engineers Inc. (IEEE)
الموضوعBand gap
Chemical tuning
Nanomaterials
Semiconductors
Theory
العنوانOxygen passivation as effective technique for tailoring the nature of band gap of silicon nanowires
النوعConference
الصفحات951-954
الترقيم الدولي الموحد للكتاب (إلكتروني) 978-1-4673-8156-7
dc.accessType Full Text


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