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AuthorSeireg, R.
AuthorAl Emadi, N.
AuthorAbdel Naby, M.
AuthorEl Refaie, O.
Available date2024-08-12T08:26:58Z
Publication Date2002
Publication NameProceedings of the International Conference on Microelectronics, ICM
ResourceScopus
URIhttp://dx.doi.org/10.1109/ICM-02.2002.1161538
URIhttp://hdl.handle.net/10576/57615
AbstractThe functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The faulty and non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on Zero-Crossing technique to evaluate the faulty circuits. The effect of tolerance from 0 to 20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method.
Languageen
PublisherIEEE
SubjectCircuit faults
Circuit testing
Compaction
Computer science
Detectors
Educational institutions
Frequency
Military computing
System testing
Test pattern generators
TitleAnalog testing using Zero-Crossing technique
TypeConference
Pagination237-240
Volume Number2002-January
dc.accessType Full Text


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