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Re-emission of slow positrons from tungsten at elevated temperatures
(
Elsevier
, 2002 , Conference Paper)
A series of measurements have been made on the dependence of the intensity and energy spectrum of slow positrons re-emitted from polycrystalline tungsten foil held at temperatures of up to 500 °C. Irrespective of target ...
Baseline formation for damage diagnosis in one dimensional-beam problems
(2002 , Conference Paper)
A brief account of the theories behind modal analysis, dimensional analysis, the stereolithography process and the strain energy damage detection method is presented. An integrated system of those techniques is formulated ...
Tests of a diamond field-assisted positron moderator
(
Elsevier
, 2002 , Conference Paper)
Diagnostic studies have been performed on a 70 μm thick diamond film with a view to its development as a possible field-assisted moderator (FAM) for slow positron emission. The film was coated on one side with a 200 nm ...
Analog testing using Zero-Crossing technique
(
IEEE
, 2002 , Conference Paper)
The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The ...