Eeonomer 200F: A High-Performance Nanofiller for Polymer Reinforcement-Investigation of the Structure, Morphology and Dielectric Properties of Polyvinyl Alcohol/Eeonomer-200F Nanocomposites for Embedded Capacitor Applications
Author | Deshmukh, Kalim |
Author | Ahamed, M. Basheer |
Author | Deshmukh, Rajendra R. |
Author | Sadasivuni, Kishor Kumar |
Author | Ponnamma, Deepalekshmi |
Author | Pasha, S. K. Khadheer |
Author | AlMaadeed, Mariam Al-Ali |
Author | Polu, Anji Reddy |
Author | Chidambaram, K. |
Available date | 2020-11-04T10:00:41Z |
Publication Date | 2017 |
Publication Name | Journal of Electronic Materials |
Resource | Scopus |
Abstract | In the present study, Eeonomer 200F® was used as a high-performance nanofiller to prepare polyvinyl alcohol (PVA)-based nanocomposite films using a simple and eco-friendly solution casting technique. The prepared PVA/Eeonomer nanocomposite films were further investigated using various techniques including Fourier transform infrared spectroscopy, x-ray diffraction, thermogravimetric analysis, polarized optical microscopy, scanning electron microscopy and mechanical testing. The dielectric behavior of the nanocomposites was examined over a broad frequency range from 50 Hz to 20 MHz and temperatures ranging from 40°C to 150°C. A notable improvement in the thermal stability of the PVA was observed with the incorporation of Eeonomer. The nanocomposites also demonstrated improved mechanical properties due to the fine dispersion of the Eeonomer, and good compatibility and strong interaction between the Eeonomer and the PVA matrix. A significant improvement was observed in the dielectric properties of the PVA upon the addition of Eeonomer. The nanocomposites containing 5 wt.% Eeonomer exhibited a dielectric constant of about 222.65 (50 Hz, 150°C), which was 18 times that of the dielectric constant (12.33) of neat PVA film under the same experimental conditions. These results thus indicate that PVA/Eeonomer nanocomposites can be used as a flexible high-k dielectric material for embedded capacitor applications. |
Language | en |
Publisher | Springer New York LLC |
Subject | dielectric properties Eeonomer 200F FTIR PVA SEM XRD |
Type | Article |
Pagination | 2406-2418 |
Issue Number | 4 |
Volume Number | 46 |
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Center for Advanced Materials Research [1378 items ]
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Mechanical & Industrial Engineering [1396 items ]