Ismail, Abdulwahab Raid [عبد الوهاب رائد اسماعيل] (
Qatar University
, 2002 , Article)
This paper describes the effect of classical thermal (CTA) and rapid thermal annealing (RTA) on the electrical characteristics (I-V, C-V) of isotype Ge/Si heterojunction.
The I-V characteristics were improved after annealing ...