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AuthorAl-Qaradawi, I. Y.
AuthorSellin, P. A.
AuthorColeman, P. G.
Available date2023-11-19T10:14:24Z
Publication Date2002-06-21
Publication NameApplied Surface Science
Identifierhttp://dx.doi.org/10.1016/S0169-4332(02)00083-1
CitationAl-Qaradawi, I. Y., Sellin, P. A., & Coleman, P. G. (2002). Tests of a diamond field-assisted positron moderator. Applied surface science, 194(1-4), 29-31.‏
ISSN01694332
URIhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0037150975&origin=inward
URIhttp://hdl.handle.net/10576/49481
AbstractDiagnostic studies have been performed on a 70 μm thick diamond film with a view to its development as a possible field-assisted moderator (FAM) for slow positron emission. The film was coated on one side with a 200 nm gold electrode and on the other with a similar thickness of gold in the form of a fine mesh (10 μm lines, 40 μm spaces) in the central part of the diamond surface and a solid edge for electrical contact. A potential difference of up to 300 V could be held across the film with a leakage current of ∼ 10 nA. Although positron re-emission was observed from the diamond surface, the re-emitted fraction was observed to decrease when a bias of 300 V was applied across the film. This negative result is interpreted in terms of the drifting of thermalised positrons to the gold mesh lines, a conclusion supported by Doppler broadening measurements. The potential for the development of a diamond-film-based positron beam tagger is discussed. © 2002 Elsevier Science B.V. All rights reserved.
Languageen
PublisherElsevier
SubjectDiamond
Field-assisted moderator
Positron re-emission
TitleTests of a diamond field-assisted positron moderator
TypeConference Paper
Pagination29-31
Issue Number1-4
Volume Number194


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