Analog testing using Zero-Crossing technique
| Author | Seireg, R. |
| Author | Al Emadi, N. |
| Author | Abdel Naby, M. |
| Author | El Refaie, O. |
| Available date | 2024-08-12T08:26:58Z |
| Publication Date | 2002 |
| Publication Name | Proceedings of the International Conference on Microelectronics, ICM |
| Resource | Scopus |
| Abstract | The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The faulty and non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on Zero-Crossing technique to evaluate the faulty circuits. The effect of tolerance from 0 to 20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method. |
| Language | en |
| Publisher | IEEE |
| Subject | Circuit faults Circuit testing Compaction Computer science Detectors Educational institutions Frequency Military computing System testing Test pattern generators |
| Type | Conference Paper |
| Pagination | 237-240 |
| Volume Number | 2002-January |
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Electrical Engineering [2611 items ]