Browsing by Subject "Circuit testing"

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    • Analog testing using Zero-Crossing technique 

      Seireg, R.; Al Emadi, N.; Abdel Naby, M.; El Refaie, O. ( IEEE , 2002 , Conference Paper)
      The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The ...