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Author El-Muraikhi, M.en_US
Available date 2009-12-27T08:34:01Zen_US
Publication Date 2009-02-19en_US
Publication Name Materials Chemistry and Physics
Identifier http://dx.doi.org/10.1016/j.matchemphys.2009.02.061
Citation El-Muraikhi, M. (2009). Complex-impedance response of an Ag/TeO2–V2O5/Ag structure. Materials Chemistry and Physics, 116(1), 52–56en_US
URI http://hdl.handle.net/10576/10475en_US
Abstract The ac conductivity of glass samples of composition 50 mol% TeO2 and 50 mol% V2O5 has been analyzed. The samples were prepared by the usual melt-quench method. The electrical conductance and capacitance were measured over a frequency range of 20 Hz to 1 MHz and a temperature range of 293–450 K; these reveal semiconducting features based predominantly on an ionic mechanism. This is reflected in a low-frequency Cole–Cole dependence z″ (z′) for the impedance and in a linear dependence ″(′) for the dielectric constant throughout the temperature range. The dielectric and complex-impedance response of the structure measured is discussed. The relaxation time τ0 was found to decrease with increasing temperature. An equivalent circuit was proposed and its parameters calculated. Good agreement between a double-layer physical model and the parameters of the equivalent electrical circuit was obtained.en_US
Language enen_US
Publisher Elsevieren_US
Subject Semiconducting tellurite glassesen_US
Subject Vanadium glassesen_US
Subject Complex-impedance analysisen_US
Title Complex-impedance response of an Ag/TeO2-V2O5/Ag structureen_US
Type Articleen_US


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