Complex-impedance response of an Ag/TeO2-V2O5/Ag structure

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Complex-impedance response of an Ag/TeO2-V2O5/Ag structure

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dc.contributor.author El-Muraikhi, M.
dc.date.accessioned 2009-12-27T08:34:01Z
dc.date.available 2009-12-27T08:34:01Z
dc.date.issued 2009-02-19
dc.identifier.citation Volume 116, Issue 1, 15 July 2009, Pages 52-56 en_US
dc.identifier.uri http://dx.doi.org/10.1016/j.matchemphys.2009.02.061
dc.identifier.uri http://hdl.handle.net/10576/10475
dc.description.abstract The ac conductivity of glass samples of composition 50 mol% TeO2 and 50 mol% V2O5 has been analyzed. The samples were prepared by the usual melt-quench method. The electrical conductance and capacitance were measured over a frequency range of 20 Hz to 1 MHz and a temperature range of 293–450 K; these reveal semiconducting features based predominantly on an ionic mechanism. This is reflected in a low-frequency Cole–Cole dependence z″ (z′) for the impedance and in a linear dependence ″(′) for the dielectric constant throughout the temperature range. The dielectric and complex-impedance response of the structure measured is discussed. The relaxation time τ0 was found to decrease with increasing temperature. An equivalent circuit was proposed and its parameters calculated. Good agreement between a double-layer physical model and the parameters of the equivalent electrical circuit was obtained. en_US
dc.language.iso en en_US
dc.subject Semiconducting tellurite glasses en_US
dc.subject Vanadium glasses en_US
dc.subject Complex-impedance analysis en_US
dc.title Complex-impedance response of an Ag/TeO2-V2O5/Ag structure en_US
dc.type Article en_US

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