Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing

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Author Qidwai, Uvais en_US
Author Bettayeb, Maamar en_US
Author Yamani, Ahmed en_US
Available date 2009-12-29T06:15:50Z en_US
Publication Date 2007-11-24 en_US
Citation Qidwai, U.; Bettayeb, M.; Yamani, A., "Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing," Signal Processing and Communications, 2007. ICSPC 2007. IEEE International Conference on , vol., no., pp.632-635, 24-27 Nov. 2007 en_US
URI http://dx.doi.org/10.1109/ICSPC.2007.4728398 en_US
URI http://hdl.handle.net/10576/10550 en_US
Abstract Classification of defects using ultrasonic nondestructive testing (NDT) is primarily done in the field of industrial materials to provide useful information in order to assist in making administrative decisions in terms of maintenance and replacement. The technique presented in this paper utilizes the concept of defect induction as a convolution process between the clean sample and the defect signature. Hence, to identify the type of defect a deconvolution approach can be useful. Due to several similarities between the ultrasonic echoes and the usual modulated sinusoids, a motivation is present to use 4th order statistics for completely defining the waveform. Such a definition, when compared with standard defects, will provide useful insight in terms of defect classifications and understanding. en_US
Language en en_US
Publisher IEEE en
Subject Defect Deconvolution en_US
Subject Ultrasonic Nondestructive Testing en_US
Title Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing en_US
Type Conference Paper en_US


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