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Author Qidwai, Uvaisen_US
Author Bettayeb, Maamaren_US
Author Yamani, Ahmeden_US
Available date 2009-12-29T06:15:50Zen_US
Publication Date 2007-11-24en_US
Publication Name IEEE International Conference on Signal Processing and Communications (ICSPC) 2007
Citation Qidwai, U.; Bettayeb, M.; Yamani, A., "Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing," Signal Processing and Communications, 2007. ICSPC 2007. IEEE International Conference on , vol., no., pp.632-635, 24-27 Nov. 2007en_US
Abstract Classification of defects using ultrasonic nondestructive testing (NDT) is primarily done in the field of industrial materials to provide useful information in order to assist in making administrative decisions in terms of maintenance and replacement. The technique presented in this paper utilizes the concept of defect induction as a convolution process between the clean sample and the defect signature. Hence, to identify the type of defect a deconvolution approach can be useful. Due to several similarities between the ultrasonic echoes and the usual modulated sinusoids, a motivation is present to use 4th order statistics for completely defining the waveform. Such a definition, when compared with standard defects, will provide useful insight in terms of defect classifications and understanding.en_US
Language enen_US
Publisher IEEEen
Subject Defect Deconvolutionen_US
Subject Ultrasonic Nondestructive Testingen_US
Title Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testingen_US
Type Conference Paperen_US

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