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AuthorQidwai, Uvais
AuthorBettayeb, Maamar
AuthorYamani, Ahmed
Available date2009-12-29T06:15:50Z
Publication Date2007-11-24
Publication NameIEEE International Conference on Signal Processing and Communications (ICSPC) 2007
CitationQidwai, U.; Bettayeb, M.; Yamani, A., "Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing," Signal Processing and Communications, 2007. ICSPC 2007. IEEE International Conference on , vol., no., pp.632-635, 24-27 Nov. 2007
URIhttp://dx.doi.org/10.1109/ICSPC.2007.4728398
URIhttp://hdl.handle.net/10576/10550
AbstractClassification of defects using ultrasonic nondestructive testing (NDT) is primarily done in the field of industrial materials to provide useful information in order to assist in making administrative decisions in terms of maintenance and replacement. The technique presented in this paper utilizes the concept of defect induction as a convolution process between the clean sample and the defect signature. Hence, to identify the type of defect a deconvolution approach can be useful. Due to several similarities between the ultrasonic echoes and the usual modulated sinusoids, a motivation is present to use 4th order statistics for completely defining the waveform. Such a definition, when compared with standard defects, will provide useful insight in terms of defect classifications and understanding.
Languageen
PublisherIEEE
SubjectDefect Deconvolution
SubjectUltrasonic Nondestructive Testing
TitleDefect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing
TypeConference Paper


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