Browsing Electrical Engineering by Author "Li S."

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    • Amount of Secrecy Loss: A Novel Metric for Physical Layer Security Analysis 

      Li S.; Yang L.; Hasna , Mazen; Alouini M.-S.; Zhang J. ( Institute of Electrical and Electronics Engineers Inc. , 2020 , Article)
      In this letter, we present a novel and important performance metric for analyzing and evaluating the physical layer security of wireless communication systems in the presence of eavesdropping users. Specifically, we introduce ...