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Now showing items 51-57 of 57
Lifetime maximization with predictive power management in selective relay networks
(
Institute of Electrical and Electronics Engineers Inc.
, 2009 , Conference Paper)
A diversity scheme which exploits the existence of a source-destination path to improve the lifetime and outage probability of a wireless selective relay network with Amplifyand-Forward (AF) relays is proposed and studied. ...
A new angle determination method for resolvers
(
IEEE
, 2008 , Conference Paper)
A new low cost method for converting the amplitudes of the sine/cosine signals generated by the resolver into a measure of the angle of its shaft. The new method operates without lookup tables (LUT), and takes advantage ...
Lifetime maximization for greedy selective relay strategies
(2009 , Conference Paper)
In this paper we propose a new algorithm for selective relay strategies with Amplify-and-Forward (AF) relays which improves the relay network lifetime. The lifetime of the relay network is defined as the maximum number of ...
A Novel Resolver-to-360° Linearized Converter
(
IEEE
, 2004 , Article)
A novel and simple resolver-to-dc converter is presented. It is shown that by appropriate processing of the sine and cosine resolver signals, the proposed converter may produce an output voltage proportional to the shaft ...
Preventive and corrective open access system dispatch based on the voltage stability security assessment and diagnosis
(
Elsevier
, 2001 , Article)
The capabilities of the voltage stability security assessment (VSSAD) to assess proximity to and ranking voltage instability by (a) performing a contingency selection of each model determined subsystem and (b) diagnosing ...
FACTS control devices (Statcom, SSSC and UPFC) re-configuration techniques by PSIM/MATLAB
(
IEEE
, 2007 , Conference Paper)
This paper discusses comprehensively the dynamic performance of the FACTS control devices in multiple operations, hardware needed to complement the simulated models. This paper also presents the schematic and basic control ...
Analog testing using Zero-Crossing technique
(
IEEE
, 2002 , Conference Paper)
The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The ...