On Using the One-Exposure Method for Stress Measurements by X-Rays in Technology and Scientific Research

Abstract

The paper discusses the connection between macroscopic internal stresses and the technological character of technical materials. The basic theoretical relations which are used with X-Ray tensiometry of macroscopic internal stresses, and the principle of the method of one exposure, are introduced. The ability of their utilization in technology is illustrated through the examples of measuring macroscopic internal stresses of runner blades and through the determination of the yield point of steel.