تصفح Center for Advanced Materials Research حسب المؤلف "Parka, Minseo"
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Study of device instability of bottom-gate ZnO transistors with sol-gel derived channel layers
Yapabandara, Kosala; Mirkhani, Vahid; Sultan, Muhammad Shehzad; Ozden, Burcu; Khanal, Min P.; Parka, Minseo... more authors ... less authors ( American Institute of Physics Inc. , 2017 , Article)In this paper, the authors report the device instability of solution based ZnO thin film transistors by studying the time-evolution of electrical characteristics during electrical stressing and subsequent relaxation. A ...